"Automatic Test Generation for Energy Consumption of Embedded Systems ..."

Raluca Marinescu et al. (2017)

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DOI: 10.1109/ICSTW.2017.19

access: closed

type: Conference or Workshop Paper

metadata version: 2024-02-05

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Raluca Marinescu, Eduard Paul Enoiu, Cristina Seceleanu, Daniel Sundmark:
Automatic Test Generation for Energy Consumption of Embedded Systems Modeled in EAST-ADL. ICST Workshops 2017: 69-76

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