"BEN: A combinatorial testing-based fault localization tool."

Laleh Shikh Gholamhossein Ghandehari et al. (2015)

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DOI: 10.1109/ICSTW.2015.7107446

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Laleh Shikh Gholamhossein Ghandehari, Jaganmohan Chandrasekaran, Yu Lei, Raghu Kacker, D. Richard Kuhn:
BEN: A combinatorial testing-based fault localization tool. ICST Workshops 2015: 1-4

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