"A Method to Recover Design Patterns Using Software Product Metrics."

Hyoseob Kim, Cornelia Boldyreff (2000)

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DOI: 10.1007/978-3-540-44995-9_19

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-23

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Hyoseob Kim, Cornelia Boldyreff:
A Method to Recover Design Patterns Using Software Product Metrics. ICSR 2000: 318-335

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