"Hierarchical Clustering Driven Test Case Selection in Digital Circuits."

Conor Ryan et al. (2021)

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DOI: 10.5220/0010605805890596

access: closed

type: Conference or Workshop Paper

metadata version: 2021-10-14

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Conor Ryan, Meghana Kshirsagar, Krishn Kumar Gupt, Lukas Rosenbauer, Joseph P. Sullivan:
Hierarchical Clustering Driven Test Case Selection in Digital Circuits. ICSOFT 2021: 589-596

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