"Prioritizing Test Inputs for Deep Neural Networks via Mutation Analysis."

Zan Wang et al. (2021)

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DOI: 10.1109/ICSE43902.2021.00046

access: closed

type: Conference or Workshop Paper

metadata version: 2021-07-23

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Zan Wang, Hanmo You, Junjie Chen, Yingyi Zhang, Xuyuan Dong, Wenbin Zhang:
Prioritizing Test Inputs for Deep Neural Networks via Mutation Analysis. ICSE 2021: 397-409

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