"Inferring developer expertise through defect analysis."

Tung Thanh Nguyen et al. (2012)

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DOI: 10.1109/ICSE.2012.6227095

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Tung Thanh Nguyen, Tien N. Nguyen, Evelyn Duesterwald, Tim Klinger, Peter Santhanam:
Inferring developer expertise through defect analysis. ICSE 2012: 1297-1300

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