"A Simple Confidence-Supervised Model for High-Resolution Defect Recognition."

Hui-Yue Yang et al. (2024)

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DOI: 10.1109/ICRCA60878.2024.10649062

access: closed

type: Conference or Workshop Paper

metadata version: 2024-09-30

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Hui-Yue Yang, Hui Chen, Fan Zhang, Xiang Tian, Luning Zhu, Guiguang Ding:
A Simple Confidence-Supervised Model for High-Resolution Defect Recognition. ICRCA 2024: 380-384

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