"EYESEE: A machine vision system for inspection of integrated circuit chips."

Michael L. Baird (1985)

> Home

Details and statistics

DOI: 10.1109/ROBOT.1985.1087249

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-22

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/icra/Baird85
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/icra/Baird85
Michael L. Baird:
EYESEE: A machine vision system for inspection of integrated circuit chips. ICRA 1985: 444-448

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.