"Few-Shot and Portable 3D Manufacturing Defect Tracking with Enterprise ..."

Yiyong Tan, Bhaskar Banerjee, Rishi Ranjan (2024)

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DOI: 10.1007/978-3-031-80136-5_2

access: closed

type: Conference or Workshop Paper

metadata version: 2024-12-12

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Yiyong Tan, Bhaskar Banerjee, Rishi Ranjan:
Few-Shot and Portable 3D Manufacturing Defect Tracking with Enterprise Digital Twins Based Mixed Reality. ICPR (33) 2024: 17-32

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