"Fault prognostic and prediction based on the importance degree of test point."

Wenkui Hou, Junfeng Yan (2015)

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DOI: 10.1109/ICPHM.2015.7245025

access: closed

type: Conference or Workshop Paper

metadata version: 2017-08-25

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Wenkui Hou, Junfeng Yan:
Fault prognostic and prediction based on the importance degree of test point. ICPHM 2015: 1-5

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