"On the use of synthetic images in deep learning for defect recognition in ..."

Clement Mailhe, Amine Ammar, Francisco Chinesta (2023)

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DOI: 10.1145/3589572.3589584

access: closed

type: Conference or Workshop Paper

metadata version: 2025-01-19

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Clement Mailhe, Amine Ammar, Francisco Chinesta:
On the use of synthetic images in deep learning for defect recognition in industrial infrastructures. ICMVA 2023

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