"Random pattern testing for MCM interconnect using computer generated ..."

Chi-Yuan Chang (2010)

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DOI: 10.1109/ICMLC.2010.5580914

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-21

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Chi-Yuan Chang:
Random pattern testing for MCM interconnect using computer generated hologram technology. ICMLC 2010: 2653-2657

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