"Unsupervised Anomaly Detection and Root Cause Analysis for an Industrial ..."

Chenwei Sun et al. (2022)

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DOI: 10.1109/ICMLA55696.2022.00113

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-06

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Chenwei Sun, Martin Trat, Janek Bender, Jivka Ovtcharova, George Jeppesen, Jan Bär:
Unsupervised Anomaly Detection and Root Cause Analysis for an Industrial Press Machine based on Skip-Connected Autoencoder. ICMLA 2022: 681-686

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