"Fine-grained Local Sensitivity Analysis of Standard Dot-Product ..."

Aaron J. Havens et al. (2024)

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DOI: —

access: open

type: Conference or Workshop Paper

metadata version: 2024-09-02

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  dblp key:
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Aaron J. Havens, Alexandre Araujo, Huan Zhang, Bin Hu:
Fine-grained Local Sensitivity Analysis of Standard Dot-Product Self-Attention. ICML 2024

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