"A Parametric Study of Thermal Effects on the Reliability of RF MEMS Switches."

Jonathan Lueke et al. (2005)

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DOI: 10.1109/ICMENS.2005.17

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Jonathan Lueke, Noor Al Quddus, Walied A. Moussa, Aman Chahal:
A Parametric Study of Thermal Effects on the Reliability of RF MEMS Switches. ICMENS 2005: 30-31

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