"Towards an automated and reusable in-field self-test solution for MPSoCs."

Ahmed Ibrahim, Hans G. Kerkhoff (2016)

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DOI: 10.1109/ICM.2016.7847862

access: closed

type: Conference or Workshop Paper

metadata version: 2020-03-27

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Ahmed Ibrahim, Hans G. Kerkhoff:
Towards an automated and reusable in-field self-test solution for MPSoCs. ICM 2016: 249-252

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