"A Bayesian image analysis framework for post placement quality inspection ..."

Michael E. Zervakis, Stefanos Goumas, George A. Rovithakis (2002)

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DOI: 10.1109/ICIP.2002.1040009

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-25

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Michael E. Zervakis, Stefanos Goumas, George A. Rovithakis:
A Bayesian image analysis framework for post placement quality inspection of components. ICIP (2) 2002: 549-552

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