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"Similitude Invariant Pattern Recognition on Technical Documents."
Jean-Marc Ogier et al. (1999)
- Jean-Marc Ogier, Claude Cariou, Sébastien Adam, Joël Gardes, Rémy Mullot, Yves Lecourtier:
Similitude Invariant Pattern Recognition on Technical Documents. ICIP (1) 1999: 570-574
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