"A consistent two-level metric for evaluation of automated abandoned object ..."

Patrick Krusch et al. (2017)

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DOI: 10.1109/ICIP.2017.8297104

access: closed

type: Conference or Workshop Paper

metadata version: 2018-02-23

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Patrick Krusch, Erik Bochinski, Volker Eiselein, Thomas Sikora:
A consistent two-level metric for evaluation of automated abandoned object detection methods. ICIP 2017: 4352-4356

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