![](https://dblp.uni-trier.de./img/logo.ua.320x120.png)
![](https://dblp.uni-trier.de./img/dropdown.dark.16x16.png)
![](https://dblp.uni-trier.de./img/peace.dark.16x16.png)
Остановите войну!
for scientists:
![search dblp search dblp](https://dblp.uni-trier.de./img/search.dark.16x16.png)
![search dblp](https://dblp.uni-trier.de./img/search.dark.16x16.png)
default search action
"Neural netwok based X-ray tomography for fast inspection of apples on a ..."
Eline Janssens et al. (2015)
- Eline Janssens, Jan De Beenhouwer
, Mattias Van Dael, Pieter Verboven
, Bart M. Nicolaï, Jan Sijbers
:
Neural netwok based X-ray tomography for fast inspection of apples on a conveyor belt system. ICIP 2015: 917-921
![](https://dblp.uni-trier.de./img/cog.dark.24x24.png)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.