"A Novel Technique to Reduce both Leakage and Peak Power during Scan Testing."

Subhadip Kundu, Santanu Chattopadhyay, Kanchan Manna (2008)

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DOI: 10.1109/ICIINFS.2008.4798402

access: closed

type: Conference or Workshop Paper

metadata version: 2021-08-12

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Subhadip Kundu, Santanu Chattopadhyay, Kanchan Manna:
A Novel Technique to Reduce both Leakage and Peak Power during Scan Testing. ICIIS 2008: 1-6

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