"A Multi-step Approach for Identifying Unknown Defect Patterns on Wafer Bin ..."

Jin-Su Shin, Dong-Hee Lee (2024)

> Home

Details and statistics

DOI: 10.1007/978-3-031-58113-7_18

access: closed

type: Conference or Workshop Paper

metadata version: 2024-09-08

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/iciea/ShinL24
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/iciea/ShinL24
Jin-Su Shin, Dong-Hee Lee:
A Multi-step Approach for Identifying Unknown Defect Patterns on Wafer Bin Map. ICIEA-EU 2024: 213-226

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.