"Defect Detection and Classification of Soybean Using Convolutional Neural ..."

Fritz Carvey A. Bascara, Analyn N. Yumang (2024)

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DOI: 10.1109/ICICT62343.2024.00049

access: closed

type: Conference or Workshop Paper

metadata version: 2024-06-26

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Fritz Carvey A. Bascara, Analyn N. Yumang:
Defect Detection and Classification of Soybean Using Convolutional Neural Network. ICICT 2024: 265-270

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