"Measurements and Improvements of Conducted Electromagnetic Interference ..."

Yuh-Yih Lu et al. (2006)

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DOI: 10.1109/ICICIC.2006.113

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Yuh-Yih Lu, Zhi-Hua Chen, Chung-Hsiung Yeh, Hsiang-Cheh Huang:
Measurements and Improvements of Conducted Electromagnetic Interference Emission Caused by the Switching Circuit. ICICIC (1) 2006: 113-116

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