"Dynamic Circuit Characterization and a Single Ring-Oscillator-Based Test ..."

Haoming Zhang, Shuowei Li, Tetsuya Iizuka (2023)

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DOI: 10.1109/ICICDT59917.2023.10332260

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-07

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Haoming Zhang, Shuowei Li, Tetsuya Iizuka:
Dynamic Circuit Characterization and a Single Ring-Oscillator-Based Test Structure for Its Timing Parameter Extraction. ICICDT 2023: 76-79

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