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"Degradation in P-type Poly-Si Thin-Film Transistors under Pulse Bias Stresses."
Yining Yu et al. (2019)
- Yining Yu, Dongli Zhang, Mingxiang Wang, Huaisheng Wang:
Degradation in P-type Poly-Si Thin-Film Transistors under Pulse Bias Stresses. ICICDT 2019: 1-4
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