"Toward Reliable Extraction of the Properties of Border Traps in Lateral ..."

Ruiyuan Yin et al. (2019)

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DOI: 10.1109/ICICDT.2019.8790921

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-16

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Ruiyuan Yin, Yue Li, Wei Lin, Cheng P. Wen, Yilong Hao, Yunyi Fu, Maojun Wang:
Toward Reliable Extraction of the Properties of Border Traps in Lateral GaN Power MOSFET with a Distributed Network Model. ICICDT 2019: 1-3

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