"Simple technique for prediction of breakdown voltage of ultrathin gate ..."

Yuichiro Mitani, Kazuya Matsuzawa (2015)

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DOI: 10.1109/ICICDT.2015.7165892

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-21

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Yuichiro Mitani, Kazuya Matsuzawa:
Simple technique for prediction of breakdown voltage of ultrathin gate insulator under ESD testing. ICICDT 2015: 1-4

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