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"Investigation of Random Telegraph Noise in Advanced Silicon-On-Insulator ..."

Xinze Li et al. (2023)

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DOI: 10.1109/ICICDT59917.2023.10332402

access: closed

type: Conference or Workshop Paper

metadata version: 2024-01-04

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  - conf/icicdt/LiWTSGBMWZCGC23
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  - https://dblp.org/rec/conf/icicdt/LiWTSGBMWZCGC23
Xinze Li, Yuxuan Wu, Qiao Teng, Ying Sun, Xiao Gong, Guillaume Besnard, Christophe Maleville, Olivier Weber, Rui Zhang, Bing Chen, Dawei Gao, Ran Cheng:
Investigation of Random Telegraph Noise in Advanced Silicon-On-Insulator N-FETs: The Impact of Back Bias, Strain, and Hot Carrier Stress. ICICDT 2023: 116-119

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