"Systematic Study on Predicting the Lifetime of Si pMOSFETs During NBTI ..."

Yi Jiang et al. (2023)

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DOI: 10.1109/ICICDT59917.2023.10332378

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type: Conference or Workshop Paper

metadata version: 2024-01-04

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Yi Jiang, Yanning Chen, Fang Liu, Bo Wu, Yongfeng Deng, Junkang Li, Dawei Gao, Rui Zhang:
Systematic Study on Predicting the Lifetime of Si pMOSFETs During NBTI Stress Based on Low-Frequency Noise. ICICDT 2023: 120-123

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