"Toward Gated-Diode-BIMOS for thin silicon ESD protection in advanced ..."

Louise De Conti et al. (2017)

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DOI: 10.1109/ICICDT.2017.7993509

access: closed

type: Conference or Workshop Paper

metadata version: 2018-07-06

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Louise De Conti, Thomas Bedecarrats, Maud Vinet, Sorin Cristoloveanu, Philippe Galy:
Toward Gated-Diode-BIMOS for thin silicon ESD protection in advanced FD-SOI CMOS technologies. ICICDT 2017: 1-4

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