"Susceptibility Evaluation of 3D Integrated Static Random Access Memory ..."

Xue-Bing Cao et al. (2019)

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DOI: 10.1109/ICICDT.2019.8790857

access: closed

type: Conference or Workshop Paper

metadata version: 2019-10-18

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Xue-Bing Cao, Li-Yi Xiao, Rong-Sheng Zhang, Jia-Qiang Li, Hong-Chen Li, Jin-Xiang Wang:
Susceptibility Evaluation of 3D Integrated Static Random Access Memory with Through-Silicon Vias (TSVs). ICICDT 2019: 1-4

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