"An Industrial Defect Detection Network with Fine-Grained Supervision and ..."

Xiang Ying et al. (2023)

> Home

Details and statistics

DOI: 10.1007/978-981-99-4761-4_16

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-19

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/icic/YingYFGL23
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/icic/YingYFGL23
Xiang Ying, Hu Yifan, Xuzhou Fu, Jie Gao, Zhiqiang Liu:
An Industrial Defect Detection Network with Fine-Grained Supervision and Adaptive Contrast Enhancement. ICIC (5) 2023: 181-192

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.