"Implementation of the Pattern Matching System to Detect Flip Chip PCB Defects."

Cheol-Hong Moon, Hyun-Chul Jang, Jin-Kook Jun (2010)

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DOI: 10.1007/978-3-642-14831-6_37

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-23

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Cheol-Hong Moon, Hyun-Chul Jang, Jin-Kook Jun:
Implementation of the Pattern Matching System to Detect Flip Chip PCB Defects. ICIC (3) 2010: 273-280

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