"Generating Test Data for Both Paths Coverage and Faults Detection Using ..."

Dun-Wei Gong, Yan Zhang (2011)

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DOI: 10.1007/978-3-642-25944-9_87

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-23

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Dun-Wei Gong, Yan Zhang:
Generating Test Data for Both Paths Coverage and Faults Detection Using Genetic Algorithms. ICIC (2) 2011: 664-671

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