"A Novel Approach to Analyzing Defects: Enhancing Knowledge Graph Embedding ..."

Yanyu Chen et al. (2023)

> Home

Details and statistics

DOI: 10.1007/978-981-99-4761-4_60

access: closed

type: Conference or Workshop Paper

metadata version: 2023-08-08

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/icic/ChenHQYLHZ23
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/icic/ChenHQYLHZ23
Yanyu Chen, Jianye Huang, Jian Qian, Longqiang Yi, Jinhu Li, Jiangsheng Huang, Zhihong Zhang:
A Novel Approach to Analyzing Defects: Enhancing Knowledge Graph Embedding Models for Main Electrical Equipment. ICIC (5) 2023: 715-725

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.