"Acceleration of RAM-Tests with Associative Pattern Recognition Methods."

Djamshid Tavangarian, Christian Elm (1991)

> Home

Details and statistics

DOI: 10.1007/978-3-642-76930-6_17

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-17

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/icftcs/TavangarianE91
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/icftcs/TavangarianE91
Djamshid Tavangarian, Christian Elm:
Acceleration of RAM-Tests with Associative Pattern Recognition Methods. Fault-Tolerant Computing Systems 1991: 193-204

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.