"VLSI functional testing using critical path traces at hardware description ..."

Li Shen, Stephen Y. H. Su (1984)

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DOI: 10.1007/978-3-642-69698-5_30

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-17

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Li Shen, Stephen Y. H. Su:
VLSI functional testing using critical path traces at hardware description language level. Fehlertolerierende Rechensysteme 1984: 364-379

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