"A static test compaction technique for combinational circuits based on ..."

Yahya E. Osais, Aiman H. El-Maleh (2003)

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DOI: 10.1109/ICECS.2003.1301757

access: closed

type: Conference or Workshop Paper

metadata version: 2021-10-14

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Yahya E. Osais, Aiman H. El-Maleh:
A static test compaction technique for combinational circuits based on independent fault clustering. ICECS 2003: 1316-1319

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