"A 65nm ASIC design for measuring mental stress from the heart rate variations."

Huda Goian et al. (2017)

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DOI: 10.1109/ICECS.2017.8292037

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-02

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Huda Goian, Aamna Alali, Temesghen Habte, Hani H. Saleh:
A 65nm ASIC design for measuring mental stress from the heart rate variations. ICECS 2017: 334-338

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