"Sub-electron CIS noise analysis in 65 nm process."

Raffaele Capoccia, Assim Boukhayma, Christian C. Enz (2016)

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DOI: 10.1109/ICECS.2016.7841263

access: closed

type: Conference or Workshop Paper

metadata version: 2021-07-23

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Raffaele Capoccia, Assim Boukhayma, Christian C. Enz:
Sub-electron CIS noise analysis in 65 nm process. ICECS 2016: 560-563

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