"Hybrid neural model for automatic test pattern generation."

Joseph Bannino, Jean François Santucci, Denis Floutier (1996)

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DOI: 10.1109/ICECS.1996.582794

access: closed

type: Conference or Workshop Paper

metadata version: 2021-02-09

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Joseph Bannino, Jean François Santucci, Denis Floutier:
Hybrid neural model for automatic test pattern generation. ICECS 1996: 259-262

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