"A Minimized Test Pattern Generation Method for Ground Bounce Effect and ..."

MoonJoon Kim et al. (2006)

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DOI: 10.1007/11751632_63

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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MoonJoon Kim, JeongMin Lee, WonGi Hong, Hoon Chang:
A Minimized Test Pattern Generation Method for Ground Bounce Effect and Delay Fault Detection. ICCSA (4) 2006: 577-583

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