"Automatic mura inspection using the principal component analysis for the ..."

Jim-Woo Yun et al. (2014)

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DOI: 10.1109/ICCE-TW.2014.6904008

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-06

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Jim-Woo Yun, Heon Gu, Dae-Hwan Kim, Hoi-Sik Moon, Sung-Jea Ko:
Automatic mura inspection using the principal component analysis for the TFT-LCD panel. ICCE-TW 2014: 109-110

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