"Few Shot Ultra Fine-Grained Visual Classification for Defect Detection."

Zheng-Wei Chen, Chia-Yu Lin (2024)

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DOI: 10.1109/ICCE-TAIWAN62264.2024.10674087

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type: Conference or Workshop Paper

metadata version: 2024-11-27

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Zheng-Wei Chen, Chia-Yu Lin:
Few Shot Ultra Fine-Grained Visual Classification for Defect Detection. ICCE-Taiwan 2024: 119-120

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