"An IEEE 1149.1 Compliant Testability Architecture with Internal Scan."

Robert C. Zak Jr., Jeffrey V. Hill (1992)

> Home

Details and statistics

DOI: 10.1109/ICCD.1992.276309

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

- view
  authority control:
- export record
  dblp key:
  - conf/iccd/ZakH92
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/iccd/ZakH92
Robert C. Zak Jr., Jeffrey V. Hill:
An IEEE 1149.1 Compliant Testability Architecture with Internal Scan. ICCD 1992: 436-442

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.