"Cost-Effective Non-Scan Design for Testability for Actual Testability ..."

Dong Xiang, Yi Xu (2001)

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DOI: 10.1109/ICCD.2001.955018

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Dong Xiang, Yi Xu:
Cost-Effective Non-Scan Design for Testability for Actual Testability Improvement. ICCD 2001: 154-160

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