"On-Line BIST for Testing Analog Circuits."

Jaime Velasco-Medina, Iyad Rayane, Michael Nicolaidis (1999)

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DOI: 10.1109/ICCD.1999.808563

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Jaime Velasco-Medina, Iyad Rayane, Michael Nicolaidis:
On-Line BIST for Testing Analog Circuits. ICCD 1999: 330-

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