"Distributed automatic test pattern generation with a parallel FAN algorithm."

Stefan Radtke, Jens Bargfrede, Walter Anheier (1995)

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DOI: 10.1109/ICCD.1995.528944

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Stefan Radtke, Jens Bargfrede, Walter Anheier:
Distributed automatic test pattern generation with a parallel FAN algorithm. ICCD 1995: 698-702

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