"Reducing the Cost of Test Pattern Generation by Information Reusing."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Weidong Li, Carl McCrosky, Mostafa I. H. Abd-El-Barr (1993)

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DOI: 10.1109/ICCD.1993.393360

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Weidong Li, Carl McCrosky, Mostafa I. H. Abd-El-Barr:
Reducing the Cost of Test Pattern Generation by Information Reusing. ICCD 1993: 310-313

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